Combined scanning probe microscopy and Raman spectroscopy: a new nanotechnology tool Flyer illustrating the use of SPM and Raman spectroscopy for studying nanotechnology devices. Examples are given of Raman-AFM and TERS (tip-enhanced-Raman-scattering).

File information Part number PO109 File size 267 kB File type Acrobat PDF This type of file requires a viewer, freely available from Adobe Direct download Combined scanning probe microscopy and Raman spectroscopy...

Estimated download time Connection speed Download time 56 kb 38s 512 kb 4s 2 Mb 1s

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