Application note: Analyse compound semiconductors with the inVia™ Raman microscope (pdf)

File size: 612 kB Language: English Part number: AN206(EN)-01-A

Application note:  Analyse compound semiconductors with the inVia™ Raman microscope

Over the last decade compound semiconductors have attracted a great deal of attention because they offer properties
suitable for next generation devices in a wide range of application areas. Historically, the fabrication of these devices
has been hindered by material challenges. While these have mainly been conquered at the research level, problems still
persist when scaling up to industrial production. Renishaw’s inVia Raman microscope is a non-invasive, non-destructive characterisation tool which provides sub-micrometre
information on the vibrational, crystal and electronic structure of materials.

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