Application note: Photocurrent measurements on the inVia™ confocal Raman microscope (pdf)

File size: 1.62 MB Language: English Part number: AN225(EN)-01-A

Application note:  Photocurrent measurements on the inVia™ confocal Raman microscope

When light interacts with semiconducting materials it can induce electrical currents (‘photocurrents’). These currents carry information about the electronic, optical, and charge transport properties of the material. This information is complementary to that obtainable from Raman scattering, which can identify physical changes in the material properties.


This application note demonstrates the capability to simultaneously collect Raman and photocurrent data using the photocurrent mapping module concurrently with an inVia Raman microscope.

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